Sharma, Ashok K. <br/><br/>
Semiconductor memories :  technology, testing, and reliability /  
Ashok K. Sharma. 
 - New York :  The Institute of Electrical and Electronics Engineers, Inc.,  1996. 
 - xii, 462 pages ;   26 centimeter. 
<br/><br/> Includes index.  
<br/><br/><label>ISBN: </label>0780311140 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor storage devices.
<br/><br/><label>Dewey Class. No.: </label>FOR 621.39 Sh2s 1996