La Union Provincial Library catalog › Details for: Semiconductor memories : technology, testing, and reliability /

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Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma.

By: Sharma, Ashok KMaterial type: Text

TextPublisher: New York : The Institute of Electrical and Electronics Engineers, Inc., 1996Description: xii, 462 pages ; 26 centimeterISBN: 0780311140Subject(s): Semiconductor storage devicesDDC classification: FOR 621.39 Sh2s 1996

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Item type	Current location	Collection	Call number	Status	Date due	Barcode
Books	La Union Provincial Library			Available
Books	La Union Provincial Library Foreign Section	Foreign	FOR 621.39 Sh2s 1996 (Browse shelf)	Available		005829laup

Includes index.

Colegio de San Juan de Letran Donation July 7, 2015

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