000			00796nam a22002177a 4500
001			34402701
003			laup
005			20220819125458.0
008			150715t xxu||||| |||| 00| 0 eng d
020			_a0780311140
040			_aLAUP _cLa Union Provincial Library
082			_aFOR 621.39 Sh2s 1996
100			_aSharma, Ashok K.
245			_aSemiconductor memories : _btechnology, testing, and reliability / _cAshok K. Sharma.
260			_aNew York : _bThe Institute of Electrical and Electronics Engineers, Inc., _c1996.
300			_axii, 462 pages ; _c26 centimeter.
500			_aIncludes index.
541			_aColegio de San Juan de Letran _cDonation _dJuly 7, 2015
650			_aSemiconductor storage devices.
942			_cBOOK _2ddc _h621.39 _iSh2s _kFOR _m1996
999			_c4644 _d4644